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Introduction to Quantum Metrology [Elektronisk resurs] Quantum Standards and Instrumentation / by Waldemar Nawrocki.

Nawrocki, Waldemar (författare)
SpringerLink (Online service) 
ISBN 9783319156699
Publicerad: Cham : Springer International Publishing : 2015
Engelska online resource (xiii, 279 s.)
  • E-bok
Innehållsförteckning Sammanfattning Ämnesord
Stäng  
  • Theoretical Background of Quantum Metrology -- Measures, Standards and Systems of Units -- The New SI System of Units—The Quantum SI -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect and the Resistance Standard -- Quantization of Electrical and Thermal Conductance in Nanostructures -- Single Electron Tunneling -- Atomic Clocks and Time Scales -- Standards and Measurements of Length -- Scanning Probe Microscopes -- New Standards of Mass. 
  • This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called  Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community. 

Ämnesord

Physics  (LCSH)
Engineering  (LCSH)
Electronics  (LCSH)
Physics 
Measurement Science and Instrumentation 
Nanoscale Science and Technology 
Nanotechnology and Microengineering 
Electronics and Microelectronics, Instrumentation 

Klassifikation

T50 (LCC)
PDDM (ämneskategori)
SCI068000 (ämneskategori)
530.8 (DDC)
Tf (kssb/8 (machine generated))
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